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#	Item
721	Cyclone III Device Handbook Volume 1. Chapter 12. IEEE[removed]JTAG) Boundary-Scan Testing for Cyclone III Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-04-23 01:52:16 Electronic engineering IEEE standards Embedded systems Joint Test Action Group Altera Boundary scan description language Boundary scan Electronics manufacturing Manufacturing Electronics
722	8. Configuration and Remote System Upgrades in Cyclone IV Devices May 2013 CYIV[removed]CYIV[removed] Add to Reading List Source URL: www.altera.com Language: English - Date: 2013-05-30 21:50:25 Electronics manufacturing Joint Test Action Group Field-programmable gate array Computer configuration Programmer Electronic engineering Electronics Computer hardware
723	CIII_IOE_bidirectional_IO_config [Converted] Add to Reading List Source URL: www.altera.com Language: English - Date: 2013-05-30 21:50:34 Electromagnetism Field-programmable gate array High-speed transceiver logic Conventional PCI Comparator Altera Quartus Joint Test Action Group General Purpose Input/Output Altera Electronics Electronic engineering Computer buses
724	Expect a Breakthrough Advantage in NextGeneration FPGAs WP[removed]White Paper This white paper covers examples of why telecommunication bandwidth and the Add to Reading List Source URL: www.altera.com Language: English - Date: 2013-06-05 11:12:10 Altera Field-programmable gate array Application-specific integrated circuit Joint Test Action Group Parallel computing System on a chip Digital signal processing Interlaken Xilinx Electronic engineering Electronics Fabless semiconductor companies
725	Cyclone III FPGA Starter Board Reference Manual Add to Reading List Source URL: www.altera.com Language: English - Date: 2009-06-25 22:09:32 PCI Express D-subminiature Hindustan Semiconductor Manufacturing Company Joint Test Action Group Electrical connector Pinout Daughterboard PCI Mezzanine Card Computer hardware Electronics Computer buses
726	SEU Mitigation for Stratix V Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-07-02 07:29:40 Data quality Embedded systems Computing Electronics manufacturing Joint Test Action Group Cyclic redundancy check Field-programmable gate array Error detection and correction Single event upset Electronic engineering Electronics Digital electronics
727	AN 320: OpenCore Plus Evaluation of Megafunctions Add to Reading List Source URL: www.altera.com Language: English - Date: 2007-10-26 12:15:40 Electronic design Electronic design automation Altera Logic design Field-programmable gate array VHDL Semiconductor intellectual property core Joint Test Action Group ALGOL 68 Electronic engineering Hardware description languages Altera Quartus
728	20-, 24-, 32-bit x86 tools Special Edition: Product Introduction Product Highlights Paradigm C++ Professional is the most Add to Reading List Source URL: www.devtools.com Language: English - Date: 2012-09-06 21:17:27 Embedded systems Integrated development environment Joint Test Action Group Debugging In-circuit emulator Debugger Programming tool Mobile application development Microsoft Visual Studio Software Computing Computer programming
729	PDF Document Add to Reading List Source URL: www.raspberrypi.org Language: English - Date: 2014-04-06 18:37:44 Embedded systems Linux-based devices Single-board computers Educational technology Raspberry Pi Joint Test Action Group Universal Serial Bus Booting USB mass-storage device class Computer hardware Classes of computers Computing
730	Microsoft Word - ee108a breakout user manual.doc Add to Reading List Source URL: adunar.com Language: English - Date: 2005-09-30 05:36:42 Arcade games Windows games IPod games Breakout Joint Test Action Group Digital media Application software Electronic games

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